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<?xml-stylesheet type="text/xsl" href="https://community.element14.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/"><channel><title>Manufacture of electronic components could be faster</title><link>https://community.element14.com/learn/publications/w/documents/7423/manufacture-of-electronic-components-could-be-faster</link><description /><dc:language>en-US</dc:language><generator>Telligent Community 12</generator><item><title>Manufacture of electronic components could be faster</title><link>https://community.element14.com/learn/publications/w/documents/7423/manufacture-of-electronic-components-could-be-faster</link><pubDate>Thu, 07 Oct 2021 07:25:27 GMT</pubDate><guid isPermaLink="false">93d5dcb4-84c2-446f-b2cb-99731719e767:166f85af-3053-4a86-a55e-0a5bad11140e</guid><dc:creator>e14news</dc:creator><comments>https://community.element14.com/learn/publications/w/documents/7423/manufacture-of-electronic-components-could-be-faster#comments</comments><description>Current Revision posted to Documents by e14news on 10/7/2021 7:25:27 AM&lt;br /&gt;
&lt;span&gt;The manufacturing process of tiny electronic components named MEMS - MicroElectroMechanical Systems - could be faster with parallel checking for structural deficiencies.&lt;/span&gt;&lt;br /&gt;&lt;br /&gt;&lt;span&gt;A team from SINTEF, the largest independent research group in Scandinavia, has developed a procedure they claim can cut error analysis in the production process from taking about 20 minutes to a matter of seconds.&lt;/span&gt;&lt;br /&gt;&lt;br /&gt;&lt;span&gt;The solution is simply to check the electronic components in parallel, rather than looking for problems one by one as a serial procedure.&lt;/span&gt;&lt;br /&gt;&lt;br /&gt;&lt;span&gt;So far, Kay Gastinger and the team have developed a prototype that can scan for five different types of structure at once.&lt;/span&gt;&lt;br /&gt;&lt;br /&gt;&lt;span&gt;Ultimately, they hope to be able to parallel process 100 different MEMS circuits at a time, vastly accelerating the overall analysis.&lt;/span&gt;&lt;br /&gt;&lt;br /&gt;&lt;span&gt;This is in turn expected to cut not only production time but also costs for commercial developers, who currently face a bottleneck in their workflow when the error-checking stage is reached.&lt;/span&gt;&lt;a href="http://feeds.directnews.co.uk/feedtrack/justcopyright.gif?feedid=1785&amp;amp;itemid=800209753"&gt;&lt;img alt="ADNFCR-1785-ID-800209753-ADNFCR" src="http://feeds.directnews.co.uk/feedtrack/justcopyright.gif?feedid=1785&amp;amp;itemid=800209753" /&gt;&lt;/a&gt;&lt;div style="clear:both;"&gt;&lt;/div&gt;
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