<?xml-stylesheet type="text/xsl" href="https://community.element14.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/"><channel><title>Minimizing Cable-Induced  Measurement Errors in  High Current Applications</title><link>/members-area/personalblogs/b/blog/posts/minimizing-cable-induced-measurement-errors-in-high-current-applications</link><description>In my job as an applications engineer, I’ve been fielding lots of calls about test and measurement problems that engineers encounter with high current applications like characterizing high power LED modules and high brightness light-emitting diodes (</description><dc:language>en-US</dc:language><generator>Telligent Community 12</generator></channel></rss>