NTAG I²C Demo KitNTAG I²C Demo Kit: an all-in-one demonstration/development resource for NFC connected tag chips
NTAG I²C is the latest generation of NFC connected tags from NXP semiconductors that combines a passive NFC interface with a passive serial (I²C) contact interface enabling a wide range of application for NFC interaction.
To demonstrate the unique properties of the NTAG I²C tag chip, NXP developed the NTAG I²C Demo Kit, an all-in-one demonstration/development resource for NFC connected tag chips. By including a full complement of hardware and software tools, users can not only investigate the capabilities of the chip through the various demonstrations, but also develop and test their own applications.
NXP's NTAG I²C Demo Kit supports interactive demonstrations and enables exploration of all NTAG I²C tag chip capabilities for both the hardware and the application developer.
Optionally, the addition of the LPC-Link2 Debugger probe kit (OM13054) allows easy debugging of code ported directly into the NTAG I²C Explorer board, facilitating custom applications.
Key Features
Main Board: A dual purpose demonstration and development hardware board based on the NXP LPC 812 microcontroller with NXP PCT2075 temperature sensor, I²C serial bus connector, and JTAG debug connector to demonstrate bi-directional I²C serial bus/NFC communication, monitor energy harvesting capability and provide a localized application development environment.
Class 5 Antenna Board: NTAG I²C tag chip mounted on a class 5 antenna FR4 PCB-based with separate antenna pads for custom antenna use and with built-in I²C serial bus interface.
NFC Forum type 2 compliant which has an operating frequency of 13.56 MHz
This set of hardware is complemented by an Android app available on Playstore for a complete interaction with an NFC enabled phone.
Thanks to the on-board JTAG connector of the Main Board, the addition of the LPC-Link2 Debugger probe kit (OM13054) allows easy debugging of code ported directly into the NTAG I²C Demo Kit, facilitating custom applications.
Webinar
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Testers will be selected on the basis of quality of applications: we expect a full and complete description of why you want to test this particular product.
Testers are required to produce a full, comprehensive and well thought out review within 2 months of receipt of the product.
Failure to provide this review within the above timescale will result in the enrolee being excluded from future RoadTests.
Many thanks to all who applied for this RoadTest; there were many innovative and inventive applications to consider. It wasn't a straightforward matter to pick only 5. However, in this instance we've selected:
Al administador del RoadTest veo que la pagina tiene una fecha limite para subir la aplicacion para el NXP NTAG, dice que cierra mañana en una pagina y dentro dice que cierra el dia de hoy por lo que no concuerda el conteo tampoco.
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