<?xml-stylesheet type="text/xsl" href="https://community.element14.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/"><channel><title>Both MCUs and SBCs are the backbone of embedded architectures</title><link>/technologies/embedded/b/blog/posts/both-mcus-and-sbcs-are-the-backbone-of-embedded-architectures</link><description>Vehicle Electrification is an automotive global market trend that self-driving cars and trucks are adopting to help centralize control and seamless exchange of data and information across systems, to reduce hazards, decrease emissions, and optimize t</description><dc:language>en-US</dc:language><generator>Telligent Community 12</generator><item><title>RE: Both MCUs and SBCs are the backbone of embedded architectures</title><link>https://community.element14.com/technologies/embedded/b/blog/posts/both-mcus-and-sbcs-are-the-backbone-of-embedded-architectures</link><pubDate>Wed, 15 Aug 2018 16:07:41 GMT</pubDate><guid isPermaLink="false">93d5dcb4-84c2-446f-b2cb-99731719e767:56b3ab1e-ac01-49d8-9bd7-76f4dfa40761</guid><dc:creator>yoSoyTono</dc:creator><slash:comments>0</slash:comments><description>&lt;p&gt;If you are interested in the latest functional safety innovations at the power management level (SBC), NXP just updated its &lt;strong&gt;&lt;a class="jive-link-external-small" href="https://www.nxp.com/docs/en/white-paper/CS-FS-WP.pdf" rel="nofollow ugc noopener" target="_blank"&gt;Safe and Robust Functional Safety System Basis Chip (SBC) For Future Transportation Systems&lt;/a&gt;&lt;/strong&gt; white paper, covering from the development phase to system design —emphasizing the link to reliability and how to enable safety-ready hardware.&lt;/p&gt;&lt;p&gt;&amp;nbsp;&lt;/p&gt;&lt;p&gt;The paper also shows how using ASIL-D architecture can improve the embedded system functional robustness with a destructive test performed on the Integrated Circuit (IC) —showing the robustness of the safety architecture and how the safe state is activated in case of destruction by an Electrical Over Stress (EOS).&lt;/p&gt;&lt;img src="https://community.element14.com/aggbug?PostID=5362&amp;AppID=7&amp;AppType=Weblog&amp;ContentType=0" width="1" height="1"&gt;</description></item></channel></rss>