<?xml-stylesheet type="text/xsl" href="https://community.element14.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/"><channel><title>Learn more about high power device characterization</title><link>/technologies/test-and-measurement/b/blog/posts/learn-more-about-high-power-device-characterization</link><description>Today&amp;#39;s tests of high power devices made from new materials such as SiC and GaN put high requirements on test equipment. Even when the types of tests are similar to the ones with Silicon based devices, the DC and AC testing involves significantly...</description><dc:language>en-US</dc:language><generator>Telligent Community 12</generator></channel></rss>