<?xml-stylesheet type="text/xsl" href="https://community.element14.com/cfs-file/__key/system/syndication/rss.xsl" media="screen"?><rss version="2.0" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:slash="http://purl.org/rss/1.0/modules/slash/" xmlns:wfw="http://wellformedweb.org/CommentAPI/"><channel><title>New Scanning Transmission Electron Microscopy Technique to View Materials at Sub-Angstrom Levels</title><link>/technologies/test-and-measurement/b/blog/posts/new-scanning-transmission-electron-microscopy-technique-to-view-materials-at-sub-angstrom-levels</link><description>The new technique could allow engineers to create new materials with desired properties for applications in data storage, quantum computing, and energy storage. (Image credit: UCI ) Researchers from the University of California (Irvine) have dev...</description><dc:language>en-US</dc:language><generator>Telligent Community 12</generator></channel></rss>