Tools & Test Equipment II: Source Measure Units
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The element14 ESSENTIALS of Source Measure Units (SMUs) covers the basic concepts of SMUs, their functionality, and some use case applications. To extend the knowledge covered in the main module, this supplementary guide discusses the types of SMUs used for testing and evaluation.
Source Measure Units
The 2450 is Keithley's next-generation SourceMeter source measure unit (SMU) instrument that truly brings Ohm's law (current, voltage, and resistance) testing right to your fingertips. Its innovative graphical user interface (GUI) and advanced, capacitive touchscreen technology allow intuitive usage and minimize the learning curve to enable engineers and scientists to learn faster, work smarter, and invent easier. The 2450 is the SMU for everyone: a versatile instrument, particularly well-suited for characterizing modern scaled semiconductors, nano-scale devices and materials, organic semiconductors, printed electronics, and other small-geometry and low-power devices. All this combined with Keithley SMU precision and accuracy allows users to Touch, Test, Invent
with the new favorite go-to instrument in the lab for years to come.
The Model 2460 High Current SourceMeter Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 7A DC and pulse current capability, the Model 2460 is optimized for characterizing and testing high power materials, devices, and modules such as silicon carbide (SiC), gallium nitride (GaN), DC-DC converters, power MOSFETs, solar cells and panels, LEDs and lighting systems, electrochemical cells and batteries, and much more. These new capabilities, combined with Keithley's decades of expertise in developing high precision, high accuracy SMU instruments, will make the Model 2460 a "go-to instrument" for high current applications in the lab and in the rack for years to come.
The 2470 High Voltage SourceMeter Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more. These new capabilities, combined with Keithley's decades of expertise in developing high precision, high-accuracy SMU instruments, make the 2470 a "go-to instrument" for high-voltage source and low-current measurement applications in the lab and in the test rack.
Keithley's Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter SMU instrument is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter SMU instruments invaluable for a wide range of characterization and production test applications.
The new 2601B-PULSE System SourceMeter 10 µs Pulser/SMU Instrument with PulseMeter
technology is an industry-leading high current/high speed pulser with measure plus the full functionality of a traditional SMU. This new pulser offers leading 10 A current pulse output at 10 V with a pulse width minimum of 10 µs, perfect for testing vertical cavity surface emitting lasers (VCSEL) used in LIDAR and facial recognition, LEDs for lighting and displays, semiconductor device characterization, surge protection testing, and so much more. The pulser's built-in dual 1 Megasample/second (MS/s), 18-bit digitizers make it possible to acquire both pulse current and voltage waveforms simultaneously without the need to use a separate instrument. The 2601B-PULSE is a powerful solution that significantly boosts productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test. For automated system applications, the 2601B-PULSE's Test Script Processor (TSP) runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, the Keithley TSP-Link technology works together with TSP technology to enable high-speed, pulser/SMU-per-pin parallel testing. Because the 2601B-PULSE offers full isolation that does not require a mainframe, it can be easily reconfigured and re-deployed as your test applications evolve.
The Series 2600B System SourceMeter SMU Instruments are the industry's leading current/voltage source and measure solutions, and are built from Keithley's third generation SMU technology. The Series 2600B offers single- and dual-channel models that combine the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator, and electronic load – all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity in applications ranging from bench-top I-V characterization through highly automated production test. Built-in web browser based software enables I-V testing through any computer from anywhere in the world. Or, use your Android smart device to perform plug & play I-V testing with fingertip control with the Keithley IVy application. For automated system applications, the Series 2600B's Test Script Processor (TSP) runs complete test programs from inside the instrument for industry-best throughput. In larger, multi-channel applications, Keithley's TSP-Link Technology works together with TSP Technology to enable high-speed, SMU-per-pin parallel testing. Because Series 2600B SourceMeter SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily reconfigured and re-deployed as your test applications evolve.
The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize and test high power electronics. This SMU instrument can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies.
The 2657A is a high voltage, high power, low current source measure unit (SMU) instrument that delivers unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. The Model 2657A is designed specifically for characterizing and testing high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials in which high voltage, fast response, and precise measurements of voltage and current are required.
The 2606B System SourceMeter Source Measure Unit (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. Built from Keithley's third generation SMU technology, the 2606B offers the combined capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, and pulse generator-all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity for demanding automated qualification and production testing for optoelectronic devices such as VCSELs/laser diodes used in 3D sensing, telecommunication, and LEDs used in consumer products and automobiles, as well as integrated devices like analog ICs, ASICs, and system-on-a-chip (SOC) devices. When a high SMU channel count is required, multiple 2606B units can be stacked on top of each other without the need for thermal spacing between units. Built-in web browser-based software enables communicating to the 2606B through any computer from anywhere in the world. For automated system applications, the 2606B's Test Script Processor (TSP) technology runs complete test programs from inside the instrument for industrybest throughput. In larger, multi-channel applications, Keithley's TSP-Link technology works together with TSP technology to enable high-speed, SMU-per-pin parallel testing. Each 2606B SMU is code compatible with the industry leading Keithley 2602B System SourceMeter SMU Instrument when you are using the new ranges.
The Models 2510 and 2510-AT2510-AT TEC SourceMeter SMU instruments enhance Keithley's CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley's expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module's Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately. The Model 2510-AT2510-AT expands the capability of the Model 2510 by offering autotuning capability. P, I, and D (proportional, integral, and derivative) values for closed loop temperature control are determined by the instrument using a modified Zeigler-Nichols algorithm. This eliminates the need for users to determine the optimal values for these coefficients experimentally. In all other respects, the Model 2510 and Model 2510-AT2510-AT provide exactly the same set of features and capabilities.
The Model 2502 Dual-Channel Picoammeter provides two independent picoammeter-voltage source channels for a wide range of low level measurement applications including laser diode testing. The Model 2502 is also designed to increase the throughput of Keithley's LIV (lightcurrent-voltage) test system for production testing of laser diode modules (LDMs). Developed in close cooperation with leading manufacturers of LDMs for fiberoptic telecommunication networks, this dual-channel instrument has features that make it easy to synchronize with other system elements for tight control over optical power measurements. The Model 2502 features a high speed analog output that allows using the LIV test system at the fiber alignment stage of the LDM manufacturing process. Through the use of buffer memory and a Trigger Link interface that's unique to Keithley instruments, the Model 2502 can offer the fastest throughput available today for LIV testing of laser diode modules. These instruments are ruggedly engineered to meet the reliability and repeatability demands of continuous operation in round the-clock production environments.
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