An optical surface profiler will be unveiled at an exhibition this week that is optimised for high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS).
The ContourGT-X8, made by Veeco, combines non-contact 3D measurement capability with the manufacturer's own unique metrology hardware and software applications.
Mark Munch, executive vice-president of the firm's Metrology and Instrumentation division, said that the rapid growth of PSS as a key innovation for boosting efficiency and colour consistency in HB-LEDs is becoming a critical part of production.
"Now, the ContourGT-X8 PSS gives wafer suppliers and HB-LED device manufacturers an affordable way to obtain high-throughput, 3D surface metrology to enhance productivity, while assuring the quality of their end products."
The new application will be demonstrated at the Semicon West trade shows and seminars, which take place in San Francisco from today (July 13th) until Thursday.
Veeco creates solutions for a range of sectors including life sciences and the automotive industry.