The manufacturing process of tiny electronic components named MEMS - MicroElectroMechanical Systems - could be faster with parallel checking for structural deficiencies.
A team from SINTEF, the largest independent research group in Scandinavia, has developed a procedure they claim can cut error analysis in the production process from taking about 20 minutes to a matter of seconds.
The solution is simply to check the electronic components in parallel, rather than looking for problems one by one as a serial procedure.
So far, Kay Gastinger and the team have developed a prototype that can scan for five different types of structure at once.
Ultimately, they hope to be able to parallel process 100 different MEMS circuits at a time, vastly accelerating the overall analysis.
This is in turn expected to cut not only production time but also costs for commercial developers, who currently face a bottleneck in their workflow when the error-checking stage is reached.