Hi,
For an NFC application I am developing, I need to extract some path loss information from the channel between the tag and the reader. As of now, I am developing and testing with the EXPLORE-NFC board from element14 and was wondering if I could extract RSSI measurements from the tag's response. Is this possible?
Thanks in advance!
Best Regards,
Jonathan
While I do have the board, I've never actually tried it. A look at the datasheet https://www.nxp.com/docs/en/data-sheet/PN512.pdf doesn't seem to reveal any commands within the PN512's repertoire that is capable of reporting signal strength.
However there is this special test-mode called Testbus in the datasheet:
It seems to re-route test signals to the normal D0-D6 pins with D1 showing the RF level detector value. Unfortunately, this is not designed for use in regular operation and will probably prevent the chip from performing normal functions while in this mode because it seems to take over the data bus. There is not much detail as to the signals/entering/exiting the relevant modes, so unless anyone else has experience with this, you might need to confirm with NXP.
- Gough
