To demonstrate the unique properties of the NTAG I2C tag chip, NXP developed the NTAG I2C Explorer Kit, an all-in-one demonstration/development resource for NFC connected tag chips. By including a full complement of hardware and software tools, users can not only investigate the capabilities of the chip through the various demonstrations, but also develop and test their own applications.
NXP's NTAG I2C Explorer Kit supports interactive demonstrations and enables exploration of all NTAG I2C tag chip capabilities for both the hardware and the application developer. Optionally, the addition of the LPC-Link2 Debugger probe kit (OM13054) allows easy debugging of code ported directly into the NTAG I2C Explorer board, facilitating custom applications.
Presenter: Pierre Goarin
Pierre Goarin studied Microelectronics at the National Institute of Applied Sciences (INSA) in Rennes, France. Started to work at Philips/NXP Semiconductors in 2000 as a Research Scientist in Deep Submicron processes. Moved to the Identification business lines in 2008 where he enjoyed multiple positions as RFID Product Engineer & Product Manager. Currently works as Product Marketing Manager for the connected NFC tags portfolio within the NFC readers solutions business line.
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