Enroll in the RoadTest: TI Evaluation Module for ADS127L01 Delta-Sigma ADC




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About the Webinar
This presentation covers the architecture details for the two most common types of precision analog-to-digital converters (ADCs) that are widely used in a variety of consumer, automotive and industrial applications. While SAR ADCs are based on a traditional binary search algorithm, Delta-Sigma ADCs employ different configurations of complicated digital filtering to enhance the overall resolution of the ADC. Such differences in architectures lead to differences in specifications and application use cases between the two ADC types. This presentation will cover some key ADC specifications like noise, total unadjusted error, etc. and provide a comparative explanation for these specifications. Specific details related to achieving the best performance by properly driving each ADC architecture will also be covered. 
About the Presenters

Anthony Vaughan

Anthony Vaughan has worked at Texas Instruments for 15 years and has held roles in many different disciplines including product/test engineering, applications engineering and marketing.  He is currently on the marketing team in the High Speed Amplifier group in Tucson, AZ.


Ryan Callaway has been a Product Marketing Engineer for 3 years in the Delta Sigma Data Converter Group at Texas Instruments.

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Design with twice the bandwidth at a fraction of the power

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The internal circuitry connected to the reference pin of most SAR ADCs consists of switched-capacitor loads. During the conversion process, a switched-capacitor load imposes a current demand that can cause the external system’s reference-output voltage to fluctuate in time. Consequently, the reference-pin voltage also fluctuates.

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