Whether you regularly use a source measurement unit (SMU) instrument or have only considered using one, you will gain useful insights into making accurate electrical measurements with SMUs when you watch this seminar. Our SMU expert will explain the basics of how SMU instruments work, describe key features and capabilities to consider for selecting one, and compare the actual performance of different SMU instruments in "real-world" applications. In this webinar you will learn how to use a SMU instrument in ways that:
- Deliver more complete characterization of devices or materials
- Boost test system productivity
- Increase overall test system performance
The material presented in this web seminar will be of value to engineers, researchers, educators, and students who need to characterize and test semiconductor-based devices, components, materials, and technologies. Anyone with a need to measure current vs. voltage (I /V) will benefit.
Presenter: Lishan Weng
Lishan Weng is an Applications Engineer at Keithley Instruments, which is part of the Tektronix test and measurement portfolio. She has dual Masters degrees in Electrical Engineering and Physics from Purdue University, where her research interests focused on graphene device and p-type GaAs/AlGaAs heterostructures. Her previous research includes carbon nanotube based nanolithography and tunable graphene oxidation, as well as quantum transport measurement and a specialization in AFM lithography.
RoadTest
Keithley 2450 SourceMeter SMU Instrument to enrol in our RoadTest, starting September 30th; you may be able to get a Keithley 2450 SourceMeter SMU Instrument for free!
