Keithley to Supply Multiple Parametric Test Systems to X-FAB

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Press Release 6/2014

Keithley to Supply Multiple Parametric Test Systems to X-FAB

+Systems Ensure Process and Device Quality at the Foundry’s Production

Line in Malaysia+

CLEVELAND, OH – September 25, 2014 – Keithley Instruments, Inc

(http://www.keithley.com/)., a world leader in advanced electrical test

instruments and systems, today announced it had received orders for

additional S530 Parametric Test Systems from X-FAB Silicon Foundries.

X-FAB, a Germany-based foundry for analog/mixed-signal devices and micro

electro-mechanical systems (MEMS), ordered low power versions of the

S530 tester for installation on the main production line at its facility

in Kuching, Malaysia, where high voltage S530 systems are already in

place.

1. Dr. Manfred Riemer, the chief operating officer at X-FAB, said, “The

strategic cooperation and excellent support our management teams have

enjoyed through working with Keithley personnel made the decision an

easy one. The compatibility of the S530 systems with X-FAB’s

manufacturing automation systems and the high correlation with our

existing test equipment have been excellent.”

Steffen Richter, X-FAB’s group manager for process control monitoring,

will present a paper on the joint X-FAB/Keithley effort involving the

initial S530 correlation and speed optimization project at the 16th

European Manufacturing Test Conference (EMTC), to be held during

SEMICON Europa 2014 in Grenoble, France, October 7–9, 2014. The

paper, “Optimizing Automatic Parametric Test (APT) in Mixed Signal/MEMS

Foundry,” is co-authored with Alex Pronin, Ph.D., a lead applications

engineer at Keithley.

In announcing the sale, Keithley general manager Mike Flaherty noted,

“X-FAB has relied on Keithley parametric test systems for many years.

Based on their experience with our S530 high voltage systems, X-FAB

decided to add Keithley low power systems to their main production

line.”

Flaherty continued, “Keithley’s personnel worked closely with the

engineering teams to ensure the results correlated well with those from

their existing testers. Our applications team converted thousands of

lines of original test system code and then performed correlation tests,

matching more than 1200 parameters to within 3 percent of the original

vendor’s data.”

Keithley S530 Parametric Test Systems provide an exceptional low cost of

ownership, mainly for semiconductor fabs requiring high throughput

testing across a broad mix of products or wherever wide application

flexibility and fast test plan development are critical. The low power

(200V) system configuration is typically used for standard CMOS,

bipolar, MEMS, and other relatively low voltage semiconductor processes.

The high power (1kV) version is optimized for the difficult breakdown

and leakage tests that GaN, SiC, and Si LDMOS power devices demand.

For More Information

More information on Keithley S530 Parametric Test Systems is available

at: http://www.keithley.com/data?asset=52643. To learn more about

Keithley, contact the company at:

www.keithley.com (http://www.keithley.com/).

About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments

has become a world leader in advanced electrical test instruments and

systems. Our customers are scientists and engineers in the worldwide

electronics industry involved with advanced materials research,

semiconductor device development and fabrication, and the production of

end products such as portable wireless devices. The value we provide

them is a combination of products for their critical measurement needs

and a rich understanding of their applications to improve the quality of

their products and reduce their cost of test. In 2010, Keithley

Instruments joined Tektronix as part of its test and measurement

portfolio.

+* * *+

+Products and company names listed are trademarks or trade names of

their respective companies.+

++

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