LeCroy Corporation’s new WaveLink differential probe product line – the Dxx30 Series – offers models available at 8, 10 and 13 GHz. These probes offer high input dynamic range – 3.5Vpk-pk – and large offset range - ±4V. With their combination of high bandwidth and voltage range, they are said to be well suited for measuring high-speed DDR signals, such as DDR3, DDR4, and LPDDR3. The probes are available as modular components, or as complete probe systems.
Additionally, the WaveLink Dxx05 Series of High Bandwidth (13 to 25 GHz) Differential Probes will offer an increased input dynamic range of 2.0Vpk-pk (from a previous 1.6Vpk-pk). For this bandwidth class of differential probe, this is claimed to be the largest input dynamic range available with guaranteed performance.
The new probe series is supplied standard with two solder-in leads (Dxx30-SI) rated to the full bandwidth of the probe amplifier. The Dxx30-SI solder-in tip utilizes an external terminating resistor located as close to the circuit as possible to minimize tip inductance, maximize tip resistance, and provide the highest possible impedance and best loading over a broad range of frequencies. Should the need arise, the terminating resistors are field replaceable. A square pin lead is also provided standard. This lead is rated to 3 GHz.
Also making a recent debut from LeCroy are two new lines of its WaveAce oscilloscope series─the WaveAce 1000 and WaveAce 2000. WaveAce 1000 oscilloscopes feature a sample rate of up to 1 GS/s with 2 Mpts of memory in two-channel models from 40 MHz to 100 MHz. WaveAce 2000 oscilloscopes deliver sample rates of up to 2 GS/s and 24 kpts of memory and are available in two- and four-channel models from 70 MHz up to 300 MHz. All new WaveAce oscilloscopes feature a 7" widescreen display, and debug tools such as 32 automatic measurements, waveform math capabilities, pass/fail mask testing, large internal storage, remote control and waveform recorder. Integration with LeCroy's logic analyzer and waveform generators provides expanded debug and testing capabilities.