Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System. It integrates ultra-fast voltage waveform generation and current/voltage measurement capabilities into the Model 4200-SCS’s already powerful test environment to deliver the industry’s broadest dynamic range of voltage, current, and rise/fall/pulse times, expanding the system’s materials, device, and process characterization potential dramatically. Just as important, the Model 4225-PMU makes ultra-fast I-V sourcing and measurement as easy as making DC measurements. Its wide programmable sourcing and measurement ranges, pulse widths, and rise times make it well-suited for applications that demand both ultra-fast voltage outputs and synchronized measurement—from nanometer CMOS to flash memory. For more information, visit http://keithley.acrobat.com/p77402742/ or read the attached press release.
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