Keithley Instruments, Inc.(NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010. This one-hour seminar will discuss the keys to getting good C-V measurement results and will help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V. To register for this event, visit http://www.keithley.info/cvtesting10.
Those participating in Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will have the opportunity to learn:
- How to properly connect a C-V instrument to a probe station
- Common cable correction techniques
- Performance verification at the probe tips
- How to identify and troubleshoot typical C-V errors
- How to implement extended C-V applications, such as high voltage and quasistatic C-V
This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.
About the Presenter
Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
Registration Information
Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be broadcast on Thursday, March 25, 2010 at 15:00CET (2 p.m. GMT) for the European audience. The event is free to the public, but participants must register in advance at http://www.keithley.info/cvtesting10.