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Forum First Test Set to Characterize PCIe 3.0 Receivers
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Related

First Test Set to Characterize PCIe 3.0 Receivers

GardenState
GardenState over 15 years ago

The PCI-SIG recently released Revision 3.0 of the PCIe base specification. Many changes in the physical-layer specification are related to ensuring proper bit transmission at 8 GT/s over inexpensive PC boards.
 
Devices operating at 8 GT/s present new measurement challenges that require new tools and procedures to accurately validate receiver design. These challenges include optimizing transmit and receive equalization, calibration channel design and device link training with 128/130-bit coded pattern sequences. One of the most challenging requirements is implementing a new procedure for calibrating PCIe 3.0 stress conditions as a reference receiver would see them after applied equalization. The procedure requires engineers to post-process signals measured at an accessible test point.
 
To meet these requirements Agilent Technologies has announced the industry's first test set for PCI Express 3.0 receiver characterization and compliance testing. The Agilent PCIe 3.0 receiver characterization test solution lets users accurately characterize and verify standard compliance of receiver ports in ASICs and chipsets. Agilent's PCIe 3.0 receiver test solution is based on the J-BERT N4903B high-performance serial BERT, the N4916B de-emphasis signal converter, the 81150A-00281150A-002 pulse function arbitrary noise generator, an Infiniium 90000 X-Series high-performance oscilloscope, new accessories and new N5990A test automation software.
 
The system offers stress calibration software, adjustable pre- and post-cursor de-emphasis, built-in PCIe 3.0-compliant jitter and sinusoidal interference sources, PJ sweep functionality, and PCIe 3.0-compliant calibration channels.
 
All new products may be ordered in March 2011.

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