Press Release 11/2011
Keithley Publishes Free Tutorial Poster on Nano-technology Measurement Techniques
Cleveland, Ohio, April 2011 * * * Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative poster on nanotechnology measurement tips and techniques. A free copy of the poster, titled “Measurement Techniques for Characterizing Graphene, Carbon Nanotubes, and Nano-materials and Devices: Low Power, Low Voltage, Low Re-sistance” is available upon request from Keithley at: http://www.keithley.com/pr/086.
The poster is divided into several topic areas:
• Measurement Technique for Hall Voltage and Resistivity Measurements
• Technique for Measuring Resistance as a Function of Gate Voltage
• Circuit to Measure Drain Family of Curves on a Carbon Nanotube
• Avoiding Sources of Error When Measuring Low Power Materials and Devices
Keithley instrumentation is helping advance the state of the art in a growing list of nanotechnology applications. Six decades of experience in designing ultra-sensitive measurement tools allow Keithley to provide university, corporate, and government labs around the world with solutions for investigating new material and device properties. Keithley partners with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, customers, and other leading nanotechnology measurement tool ven-dors to create more complete nano test solutions. The insight into emerging needs these working partnerships provide helps Keithley deliver new capabilities faster.
For More Information
To request a free copy of the poster, please visit http://www.keithley.com/pr/086. To learn more about Keithley, contact the company at: www.keithley.com
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio. * * *
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For high resolution image: http://www.ggcomm.com/KEI/NanoPoster/NanoPoster.jpg