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  • Author Author: awinning
  • Date Created: 16 Apr 2010 2:12 PM Date Created
  • Last Updated Last Updated: 7 Oct 2021 4:03 AM
  • Views 517 views
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Free Web Seminar explores Fundamentals of Ultra-Fast I-V Device Characterization

Keithley  Instruments will broadcast a free, web-based  seminar titled “Fundamentals of Ultra-Fast I-V Device Characterization” on  Thursday, April  29, 2010. This  one-hour seminar will explore the increasing importance of  Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of  device and process technologies.
To register for this event, which  will be broadcast at 15:00 Central European Summer Time (CEST), visit http://www.keithley.info/ultrafastIVa.
Ultra-Fast  Current-Voltage (I-V) testing, which includes pulsed I-V, transient I-V, and  pulsed sourcing testing, is of increasing importance in the development of new  semiconductor materials, processes, and devices. Common applications include  non-volatile memory devices (NVM) such as Flash and phase change memory,  isothermal characterization on silicon-on-insulator (SOI) devices and compound  semiconductors, and transient characteristics of new materials such as high-K  dielectrics.
“Fundamentals of  Ultra-Fast I-V Device Characterization” will cover a core description of the  measurement hardware and setups, including cabling to a probe station. The  webinar will also discuss typical uses and test setups as well as common error  sources. Finally, some practical examples of device measurements will be  given.
This seminar is recommended for students, researchers, and engineers  involved in the characterization of materials, processes, and devices. It will  also be useful for lab managers wanting to learn about this measurement  technique and engineers doing device and material reliability studies (WLR, ESD,  latchup, etc.).
 
About the  Presenter
“Fundamentals of Ultra-Fast I-V Device  Characterization” will be presented by Lee Stauffer, Senior Staff Technologist  for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland,  Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite  communication systems, as well as equipment and product engineering in  semiconductor fabs.
 
Registration Information
“Fundamentals of Ultra-Fast I-V Device  Characterization” will be broadcast on Thursday, April 29, 2010  at 15:00 CEST (1 p.m. GMT).  The event is  free to the public, but participants must register in advance at http://www.keithley.info/ultrafastIVa.
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