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EAGLE User Support (English) Testpoints for ICT testers
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Related

Testpoints for ICT testers

Former Member
Former Member over 14 years ago

Is there a way to systematically insert ICT testpoints onto a PCB layout

without putting a testpoint component on each net on my schematic?

Ideally I'd like to know the percent of nets covered by testpoints and

have someway to highlight or locate nets without a testpoint so I can

either add one or can decide that the particular net isn't worth the

trouble to test.

 

-Michael

 

 

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

    Warren Brayshaw schrieb:

     

    There have been a lot of discussion on  the placement of pads and the

    validity of testing regimes but very little on the second part of the

    question.

     

    As I understand it, most of the points contacted during testing are regular

    pads.

     

    To my knowledge, this is not true. Especially in high volume ICT,

    testpoints always are separate SMD pads. This makes sure that these

    areas are always free for the test needles and have a clean, smooth

    surface. When using pads as test points, it is very difficult to get

    reproducible contact - and the needles wear out much faster due to

    horizontal forces.

     

    So, how do you analyse the layout to determine if nets have  test points or

    pads acting as testpoints or nothing suitable?

     

    If there were special ICTP objects (as suggested), it would be no

    problem to generate a list of covered and uncovered signals, including

    statistics, with a small ULP.

     

    Tilmann

     

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

    On 12/30/2010 8:08 AM, Olin Lathrop wrote:

    Wow, that was a amazing bit of sideways logic. I was reacting to your

    rediculous assertion that you always need to give a tester access to all

    nets. It only takes a single counter example to disprove that, and I

    supplied several such counter examples.

     

    Your response is to act as if I said you are always limited to doing things

    as in the counter examples, which is completely illogical.

     

    Of course there are many methods to test a board. The point is that you

    don't always need to have access to every net, not that you should never

    have access to any net.

     

    Sorry, been traveling for some time, back in the office now.

     

    If I used sideways logic then you are just as guilty of it.  I gave you

    several counter examples where your methodology would not work and

    several points on how your way can in some cases cause you to spend

    recurring costs on the BOM, yet you choose to ignore those as well.  So,

    perhaps we are both guilty of sideways logic.

     

    I have never claimed that I want access to every net on a board in all

    cases.  Sometimes I might (particularly if it's a board with no

    microcontroller or reprogrammable logic, which I certainly admit is

    rather rare).  In fact, in general I want to use a combination of

    methodologies to do automated testing of boards.  Ideally, I'd use JTAG,

    ICT test points, and yes your method as well where appropriate

    (meaning where possible and where it does not incur recurring BOM cost).

      A mix of methods will give me the most thorough and cost effective

    means to test a populated board.

     

    In summary I still propose that CadSoft should consider a means to add

    test points during layout without adding them explicitly to the

    schematic, (much like the way we add vias).  This is supported in many

    of the major CAD systems that Eagle competes with and follows the

    methodology and division of labor used by many enterprises.

     

     

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

    On 12/31/2010 2:01 AM, Tilmann Reh wrote:

    Warren Brayshaw schrieb:

     

    >> There have been a lot of discussion on  the placement of pads and the

    >> validity of testing regimes but very little on the second part of the

    >> question.

    >>

    >> As I understand it, most of the points contacted during testing are regular

    >> pads.

     

    To my knowledge, this is not true. Especially in high volume ICT,

    testpoints always are separate SMD pads. This makes sure that these

    areas are always free for the test needles and have a clean, smooth

    surface. When using pads as test points, it is very difficult to get

    reproducible contact - and the needles wear out much faster due to

    horizontal forces.

     

    >> So, how do you analyse the layout to determine if nets have  test points or

    >> pads acting as testpoints or nothing suitable?

     

    If there were special ICTP objects (as suggested), it would be no

    problem to generate a list of covered and uncovered signals, including

    statistics, with a small ULP.

     

    Tilmann

     

    You can use regular SMT pads, but in general you shouldn't use vias (or

    at least the contract manufactures I use will not use them).

     

    Tilmann is right, in general you want to use a dedicated test pad that

    is separate from both your vias and your SMT pads.  The reasons are as

    follows:

     

    1.) CMs have problems with the ICT test probes sticking in the holes of

    vias.  In some cases this will result in the board getting hung up on

    the ICT test fixture when the fixture tries to open.  In my experience

    very few CMs will want to try this for this reason.

     

    2.) Some CMs will let you use SMT pads but they don't like it since they

    don't know the height of the solder "bump" precisely so they have some

    issues setting the ICT pin height.  They really don't like building a

    fixture that has a mix of dedicated ICT pads (which are unsoldered) and

    SMT pads with solder (or at least in my experience).  However, if your

    board is such that you can get good coverage from just the SMT pads this

    is an option.

     

    3.) Complicating point 2 is the fact that in general you want your ICT

    fixture probes to only interface with one side of the board (this is a

    cost and complexity issue, you can test on both sides if you're

    motivated).  If you've got a board with components on one side only,

    generally you're going to find that you want the ICT test points on the

    side opposite the components.  This also tends to take testing against

    your topside SMT pads off the table.  For a design with components on

    the top side only, you'll tend to be driven to putting all your ICT pads

    on the bottom side.

     

    -Michael

     

     

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

    Warren,

     

    Thanks for your suggestion.  It has proven to be the most workable near

    term solution for placing ICT test points on schematics.  I built a

    schematic symbol much like you suggested.  I used the point type symbol

    pin, I assumed that you did the same. Putting it on a separate layer

    really makes it workable.  The only (small) fly in the ointment is the

    connection dot that Eagle places when you drop the symbol on a net.  As

    you pointed out, it's completely invisible if you drop it on existing

    connection dots and turn the test point layer off.  I suppose that Eagle

    is generating a short (or even null) wire segment and joining it to the

    wire you dropped it on and generating the connection dot in the process.

      Do you know of any way to modify this behavior of Eagle while still

    getting the net connection to the test point?

     

    Thanks again for the suggestion.

     

    Regards,

     

    -Michael

     

     

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

     

    "Michael Sansom"  wrote

    Warren,

     

    Thanks for your suggestion.  It has proven to be the most workable near

    term solution for placing ICT test points on schematics.  I built a

    schematic symbol much like you suggested.  I used the point type symbol

    pin, I assumed that you did the same. Putting it on a separate layer

    really makes it workable.  The only (small) fly in the ointment is the

    connection dot that Eagle places when you drop the symbol on a net.  As

    you pointed out, it's completely invisible if you drop it on existing

    connection dots and turn the test point layer off.  I suppose that Eagle

    is generating a short (or even null) wire segment and joining it to the

    wire you dropped it on and generating the connection dot in the process.

      Do you know of any way to modify this behavior of Eagle while still

    getting the net connection to the test point?

     

    Thanks again for the suggestion.

     

    Regards,

     

    -Michael

     

     

    Hi Michael

     

    Sounds as if you are doing it the way I suggested and don't have any ideas

    to refine it any further. Since my initial response I have determined that

    circles around the junction dots work best,in my opinion, (see attached).

    You need to get the width of  the circle wire to something you like.

     

    Regards

    Warren

     

     

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    end

     

     

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  • Former Member
    Former Member over 14 years ago in reply to Former Member

    On 1/15/2011 6:20 PM, Warren Brayshaw wrote:

     

    Hi Michael

     

    Sounds as if you are doing it the way I suggested and don't have any ideas

    to refine it any further. Since my initial response I have determined that

    circles around the junction dots work best,in my opinion, (see attached).

    You need to get the width of  the circle wire to something you like.

     

    Regards

    Warren

     

     

    Yes, I built my symbol with a circle as well.  Think I used a 5 mil wire

    width (0.127 mm) and it looked fairly decent.

     

    I still say the best solution for this is for CadSoft to create a

    testpoint object in the layout tool that, like you suggested, works like

    a via without a drill.  Then you could write a ULP to add unplaced

    testpoints to the layout that the PCB designer could then place and

    route.  Your ULP might optionally load a list of net names that are to

    have test points added (there are third party tools that will analyze a

    netlist and generate a list of needed testpoints).  If you wanted to get

    really sophisticated your ULP could read your netlist and import the

    BSDL files for whatever JTAG devices you have on the board and it would

    skip placing testpoints for anything you can cover with a JTAG scan

    chain.  BSDL is just a subset of VHDL so it can be pretty readily

    parsed.  You'd probably also like the ability to attach a "no_test"

    attribute on any nets that for instance, carried high speed signals

    where a hanging testpoint might act as a stub and generate reflections

    so the ULP would skip placing testpoints on those as well.  This is all

    sort of blue sky thinking but if Eagle would support such a testpoint

    object you could do all sorts of cool things.

     

    Someone mentioned the possibility of having a ULP autoplace the

    testpoints and route them.  Some might be interested in that, but

    personally I'd be happy with just unplaced testpoints at the bottom of

    the layout.  I think a human can do a better job of looking at the trade

    offs deciding the best place to drop the testpoint and route it.

     

    Anyway, thanks for your help.  This is now a part of my layout process.

     

    -Michael

     

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